Webinar • Industria y Fabricación

Benefits of Custom Metrology Solutions for your Automated Manufacturing ProcessAgéndalo en tu calendario habitual ¡en tu horario!

Miércoles, 5 de agosto de 2020, de 14.00 a 15.00 hs Horario de Virginia (US)
Webinar en inglés

Your automated manufacturing process is uniquely integrated and optimized for each sub-system. So why rely on a metrology sub-system that has not been equally customized for your process? When applied correctly, a customized metrology and inspection system can help your automated manufacturing process achieve more.  

To effectively develop custom metrology and inspection solutions, it’s necessary to have a large pool of standard products to choose from, deep knowledge of the metrology systems, innovative ideas, the capability to execute that vision, and a global support system.  

Join us to learn how leading manufacturers are customizing their metrology and inspection systems to improve efficiency and quality of their automated manufacturing processes.  Topics of discussion will include:

  • Customized reference frames (e.g CMM & OMM) for safety, speed, range, and flexibility.
  • Customized sensors for accuracy, resolution, and multi-sensor integration.
  • Custom turn-key metrology solutions to let you focus on what you do best.
  • Custom material handling, workpiece mounting, and integration of HW and SW.



Casey Emtman, Technical Marketing Engineer, Micro Encoder Incorporated

Casey Emtman brings over 20 years of metrology R&D and project management experience through which he has built broad knowledge of non-contact metrology technologies.  Casey is a serial inventor holding nearly 20 patents and earned a Bachelor’s of Science in Mechanical Engineering degree from Washington State University.   Casey’s current focus is developing custom metrology solutions for leading manufactures across North America and Europe.  Additionally, Casey is the Director of Operations for Mitutoyo Optics Manufacturing America Corporation.


Ken Myers, Solutions Manager, Sales-Solutions Division of Mitutoyo America Corporation

Ken Myers is the Solutions Manager at Mitutoyo America Corporation.  He has 30 years’ of experience and education in the fields of electrical/controls engineering and machine design. The last 18 of those have been at MAC, developing custom measurement solutions. Coming from the custom machine and gaging design industry, he and his team of engineers has helped countless Mitutoyo customers achieve success in their pursuit of efficient throughput of quality production processes. While capitalizing on the 85 years of experience and technology development that Mitutoyo provides, as the basis for countless custom tailored measurement solutions for their clients. 

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